Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

Blog Article

We study Multiple Andreev Reflections Masthead Amplifier Power Injector in long diffusive superconductor(S)-normal metal(N)-superconductor junctions with low-transparency interfaces.Assuming strong thermalization in the weak link, we calculate the current-voltage dependence $I(V)$.At intermediate temperatures, $arepsilon_mathrm{Th}ll TllDelta$, the current is dominated by noncoherent multiple Andreev reflections and is obtained analytically.The results are generalized to a ferromagnetic junction.We find that the exchange field produces a non-trivial splitting of the subharmonic gap structure.

This effect relies on thermalization Your Joints and vanishes in SFS junctions with no energy relaxation in the weak link.